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WAN Visits RFID Exhibition on CIIF 2008

On November 4th, Minister WAN Gang visited the Exhibition Hall of Radio Frequency Identification (RFID) on 2008 China International Industry Fair (CIIF) in Shanghai. After knowing the status quo of RFID technology, WAN believed the application of the technology was extensive and important. He encouraged breakthroughs in key technologies and standard research aside from demonstration and promotion.

As a highlight of 2008 CIIF, the exhibition mainly introduced related policies and strategies, while displaying major achievements of the 863 Program “RFID Technology and Application”. The exhibition was jointly sponsored by the High-tech Department of MOST and the Science and Technology Commission of Shanghai Municipality,